AIST-NT SmartSPM 1000
AFM Electrical Sample Charaterization
AFM Force Spectroscopy
AFM Scan Size X/Y/Z µm
100 x 100 x 15
The SmartSPM 1000 Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high resolution measurements for the most advanced materials research at the nano scale in all AFM and STM modes.