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Anfatec Level AFM

AFM Type
AFM Electrical Sample Charaterization Tooltip
AFM Force Spectroscopy
AFM Scan Size X/Y/Z µm
50 x 50 x 6 or other on request
AFM-Head including a Top View USB-Camera and Sample Illumination. Our Level AFM offers a wide Spectrum of Measurement Methods:
High Resolution Dynamic & Contact Mode, Current-AFM Mode, Lateral Force Mode, Force Spectroscopy, Kelvin Probe Force Microscopy, Magnetic Force Microscopy (2nd trace imaging), Electrical Force Microscopy, Nano-Lithography with script-language, Elastic Force Microscopy (Force Modulation Mode)

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