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Ardic P100

AFM Type
Stand-alone
AFM Electrical Sample Charaterization Tooltip
-
AFM Force Spectroscopy
-
AFM Scan Size X/Y/Z µm
15 x 15 x 8
Elegantly simple. Technologically advanced.
With a sub-nanometer Z resolution, the P100 can be used for high resolution imaging and measurement. The integrated low-noise and open-loop scanner allows for quick and effective experiments up to 15 μm by 15 μm. Our unique astigmatic optical design produces a small 0.56 μm laser spot size, allowing users to experiment with smaller and faster AFM cantilevers.

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