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Ardic P150

AFM Type
Stand-alone
AFM Electrical Sample Charaterization Tooltip
-
AFM Force Spectroscopy
-
AFM Scan Size X/Y/Z µm
15 x 15 x 8
Elegantly simple. Technologically advanced.
With a sub-nanometer Z resolution, the P150 can be used for high resolution imaging and measurement. The integrated low-noise and open-loop scanner allows for quick and effective experiments up to 15 μm by 15 μm. Our unique astigmatic optical design produces a small 0.56 μm laser spot size, allowing users to experiment with smaller and faster AFM cantilevers. Included with the P150 is our highly intuitive PSX control software, which allows the user to complete experiments with minimal training. Our One-click Scan feature automates the setup and scan process, allowing users to quickly obtain high quality scan results. The built-in scan library management feature simplifies the flagging of scan data and allows the user easily delete or export scans.

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