Bruker Dimension Edge PSS
AFM Electrical Sample Charaterization
AFM Force Spectroscopy
AFM Scan Size X/Y/Z µm
The system incorporates Bruker's proprietary AutoMET control & analysis software, which has been designed specifically to meet the needs of patterned sapphire substrate (PSS) suppliers, providing a level of automation and ease of use never before seen in a value-price atomic force microscope.