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Bruker Dimension Edge PSS

AFM Type
Stand-alone
AFM Electrical Sample Charaterization Tooltip
AFM Force Spectroscopy
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AFM Scan Size X/Y/Z µm
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The system incorporates Bruker's proprietary AutoMET control & analysis software, which has been designed specifically to meet the needs of patterned sapphire substrate (PSS) suppliers, providing a level of automation and ease of use never before seen in a value-price atomic force microscope.

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