JPK NanoWizard 3 NanoOptics
Stand-alone, Integration with inverted or upright Microscopes, Raman/TERS option
AFM Electrical Sample Charaterization
AFM Force Spectroscopy
AFM Scan Size X/Y/Z µm
100 x 100 x 15
Comprehensive solution for advanced experiments combining AFM and optical spectroscopy such as TERS, Aperture SNOM and sSNOM, confocal microscopy and nano manipulation in optical fields.