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Nanonics Multiview 2000

AFM Type
Integration with upright, inverted, and dual optical microscope configuration, NSOM, Raman integration
AFM Electrical Sample Charaterization Tooltip
AFM Force Spectroscopy
AFM Scan Size X/Y/Z µm
85 x 85 x 85 and 170 x 170 x 170 (dual scanner combination)
The MultiView 2000 series is an advanced single probe scanning probe microscope enabling a variety of modes of AFM/SPM/NSOM imaging. Nanonics has designed The MultiView 2000 for excellence in scanning probe microscopy while allowing for near-field and far-field optical NSOM/Raman imaging without perturbation. The Multiview 2000 is the only commercially available instrument that offers both tip and sample scanning.

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