Nanonics MultiView 4000
Multiprobe, integrates with NSOM, Raman
AFM Electrical Sample Charaterization
AFM Force Spectroscopy
AFM Scan Size X/Y/Z µm
30 x 30 x 30 or 100 x 100 x 100 or 130 x 130 x ? or 160 x 160 x ?
AFM, NSOM and SPM multiprobe capabilities and optical and electron optical compatibility. Independent scanning of up to four probes for atomic force, near-field optical and all known probes for scanned probe imaging modes Unique probes for multiple probe resistance measurements with two, three and four point probe geometries.