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NT-MDT SPECTRUM

AFM Type
Integrated Mitutoyo Upright microscope, RAMAN, SNOM
AFM Electrical Sample Charaterization Tooltip
(✔) limited, seperate STM head
AFM Force Spectroscopy
inquire
AFM Scan Size X/Y/Z µm
100 x 100 x 10
Automated AFM-Raman-SNOM system for a wide range of applications: The World’s first fully automated AFM-Raman-SNOM instrument. Integration of AFM with multiple optical techniques: confocal Raman/fluorescence microscopy, SNOM, TERS etc. Comprehensive sample characterization on the nanoscale – easy and fast.

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