AFM Electrical Sample Charaterization
AFM Force Spectroscopy
AFM Scan Size X/Y/Z µm
25 x 25 x 15/30 or 50 x 50 x 15/30 or 100 x 100 x 15/30
More powerful failure analysis solutions: Park NX20 is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your work, while its True Non-Contact™ mode scan keeps tips sharper and longer, so you won’t have to waste as much time and money replacing them.