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Gerneral Information

Atomic Force Microscopy (AFM) or Scanning Force Microscopy (SFM) is a very high-resolution type of Scanning Probe Microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The precursor to the AFM, the Scanning Tunneling Microscope (STM), was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at IBM Research - Zurich, a development that earned them the Nobel Prize for Physics in 1986.

As the name suggests, the heart of an AFM is a probe that is scanned over the sample surface to build up some form of image. The type of image you get depends on the interaction that is measured by the probe. Images can be produced that reflect many different properties of the sample. The sample height information (topography), usually forms one aspect of the image, but images can also be collected that show other properties, including mechanical, electrostatic, optical, or magnetic information about the sample surface.

 

Different probes and measurement systems are used for some of the different properties that can be measured, but one requirement is that the interaction between the probe and the sample is localised in some way. The measured signal must be dominated by some small region of the sample close to the tip, so that an image of the sample can be formed as the tip is scanned over the surface. This implies that the interaction must have a strong distance dependence, so that only the nearest parts of the sample contribute to the interaction felt by the tip. The range of the interaction will be one factor in the final resolution of the instrument. When the interaction has a very strong distance dependence, such as the electron tunelling current used in STM, the resolution can be good enough to "feel" individual atoms.

Since the measured signal should be dominated by the small region of probe and sample that are closest together, the actual probe does not need to be an isolated point. The probe can be part of some larger structure that is more convenient to mount and scan. The size of the probe can be relatively large, perhaps hundreds of microns or more, but if the interaction has a short enough range then the signal will be dominated by the very tip region of the probe, so that resolutions can still be achieved in the range from atomic distances to microns.

The idea of a probe measuring a local interaction and building up an image is relatively straightforward, but the actual implementation of a system with a resolution in this range is technically challenging. Many factors came together in the development of scanning probe microscopy, including the development of piezoelectric materials that made it possible to reproducibly position and scan components with a sub-nanometre precision.

Here is a market overview of instruments made by specialist manufacturers and companies around the globe.

Application Notes

Piezoresponse Force Microscopy

This application note presents a primer on the direct and reverse piezoelectric effects and their uses, and the instrumentation and applications of piezoresponse force microscopy... read more

 

Choosing AFM Probes for Biological Applications

The appropriate choice of AFM probe is crucial for optimal results when imaging biological samples. This application note provides an overview of probes available for biological applications... read more

 

AFM Applications in Polymer

Polymers are the material of choice in many applications. They can be tailored to have unique properties and are often less expensive, more durable, and more sustainable than other materials. Creating and implementing new polymers requires knowledge of how structure, processing, properties, and performance are related... read more

 

Characterization of Steel by MFM and KPFM

Examination of steel by the non-contact mode AFM techniques Magnetic Force Microscopy (MFM) and Kelvin Probe Force Microscopy (KPFM) also known as Surface Potential Microscopy... read more

 

Comprehensive Analyses of Graphene

Graphene shows immense promise in many applications: transistors, sensors, and optoelectronics, to name just a few of them. Flexible and adaptive analyzing methods can support the effective investigation of graphene and accelerate the progress in graphene research and product development... read more

 

Surfactant Micelles in Aqueous Solution: Critical Resolution in AFM

It’s a widely spread idea that performing AFM in liquids is a rather complicated research approach. Actually, many tasks related to the investigation of molecular structures and complexesin a liquid environment... read more 

 

Manipulation of Gold Nanoparticles in Liquids Using MAC Mode Atomic Force Microscopy

Precise control of the structure of matter at the nanometer scale will have revolutionary implications for science and technology. Nanoelectromechanical systems (NEMS) will be extremely small and fast, and have applications that range from cell repair to ultrastrong materials... read more

 

AFM in Cosmetics Research and Product Development

Sensory perception of hair is a primary concern among cosmetic manufacturers. The way hair looks and feels to the touch is related to the structure and properties of hair at the nanometer scale. The Atomic Force Microscope (AFM) offers direct, highly localized, tactile interface with the hair’s outer surface in environments to which hair is usually exposed... read more

 

Investigation of Solar Cells

While traditional tools are helpful to investigate and improve solar cells, AFM/SPM offers metrology, topography & roughness analysis at much higher resolution than with optical techniques... read more

 

Software
n-Surf                       FlexAFM                                        TrueMap                                  
MountainsMap ImageJ Image SXM
 AtomicJ PUNIAS FemtoScan
 WSxM  SPIP  Gwyddion
 XPMPro  GXSM  MATRIX
 Nanonis    

 

 

 

News

 

 

AFM Atomic Force Microscope

JPK NanoWizard 4 BioAFM

The NanoWizard 4 BioScience AFM combines atomic resolution and fast scanning with line rates up to 70 Hz in a system with a large scan range of 100...

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JPK NanoWizard BioAFM

For applications in Soft Matter and Life Science research reaching from biophysics and cell biology to surface science and biomedicine.

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Oxford Instruments Asylum MFP-3D Origin

Designed for flexibility and expandability, witha wide range of available system, environmental and application options to enhance capabilities,...

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Anasys afm+

The afm+ from Anasys is a full featured Atomic Force Microscope with powerful analytical capabilities that make it much more than just an imaging...

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Oxford Instruments Asylum Cypher S

Oxfords Highest Resolution Fast Scanning AFM. Cypher’s proprietary system-level mechanical design is inherently immune to normal environmental...

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Nanotec Cervantes FullMode AFM

Cervantes FullMode AFM System is the best tool for characterizing and performing experiments on samples at the nanoscale. It is a modular, open and...

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Bruker Dimension Icon

Incorporating the latest evolution of Bruker’s industry-leading tip-scanning AFM technology, the Icon’s temperature-compensating position sensors...

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Bruker Innova-IRIS Integrated AFM-Raman Imaging System

Bruker’s Innova-IRIS (Integrated AFM-Raman Imaging System) enables the emerging technique of tip-enhanced Raman spectroscopy (TERS), seamlessly...

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AFMWorkshop NP-AFM

The NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the...

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Hitachi AFM5100N Compact General-Purpose Atomic Force Microscope

The Hitachi AFM5100N Atomic Force Microscope is a compact, general-purpose AFM equipped with a built-in high-resolution sensor lever for manual...

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Keysight 5500 Atomic Force Microscope

Highly modular microscope and scanner Optional Integrated environmental & temperature control Easy fluid operation with open cell Easy sample...

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NT-MDT Life

Fully automated AFM integrated with Inverted Light Microscope for biological research. LIFE is Atomic Force Microscope with XYZ scanning measuring...

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Ardic P100

Elegantly simple. Technologically advanced. With a sub-nanometer Z resolution, the P100 can be used for high resolution imaging and measurement. The...

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AIST-NT SmartSPM 1000

The SmartSPM 1000 Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological...

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Bruker Dimension FastScan

Delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating...

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DME ProberStation 150

The DME ProberStation 150TM is the ultimate stage for SPM on large samples. Its long range XY translators allow the investigation of 150 mm samples...

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Nanonics MultiView 4000

AFM, NSOM and SPM multiprobe capabilities and optical and electron optical compatibility. Independent scanning of up to four probes for atomic force,...

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Oxford Instruments Asylum MFP-3D-BIO

Uncompromised AFM performance integrated with optical microscopy. Simple, high-resolution imaging in liquid for soft biological samples. Performance...

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Park NX10

The quickest path to innovative research: Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample...

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nano pacific HighSpeed AFM

High-speed atomic force microscopy allows direct visualization of dynamic structural changes and dynamic processes of functioning biological...

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Keysight 7500

Atomic-resolution imaging with closed-loop 90μm scanner Exceptional environmental and temperature control Standard nose cone supports expanded set...

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NT-MDT OPEN

Automated AFM: Application flexibility combined with high-end resolution performance. Provides the largest suite of AFM techniques.

Details

NanoMagnetics ezAFM

The ezAFM is an all new Atomic Force Microscope which features excellent performance while being remarkably affordable. It’s ideal for student...

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WITec alpha300 RA

A unique combination of chemical and nanoscale imaging in one system: The well-established Raman-AFM combination alpha300 RA was the first...

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