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A hemispherical electron energy analyzer (or electron spectrometer) is generally used for applications where a higher resolution is needed. Electron Analyzers provide high energy resolution which allows revealing small chemical shifts in XPS, UPS and AES spectra for the precise characterization of chemical states. Electron Analyzers are suitable to integrate in existing UHV systems.
In general, an electrostatic analyzer is an instrument that employs an electric field to allow the passage of only those electrons electrons that have a given specific energy. It usually also focuses electrons into a smaller area.
Here is a market overview of instruments made by specialist manufacturers and companies around the globe.
XPS Analysis of Stainless Steel Surfaces
The surface chemistry of stainless steel is strongly influenced by the chemical or mechanical processing of that surface... read more
Graphene as Protective Coating
Graphene is a two dimensional material composed out of sp2-bonded carbon atoms arranged in the same honeycomb crystal lattice as graphite, its three dimensional counterpart. Due to its physical and chemical properties graphene renders a vast interest within a large number of scientific disciplines... read more
Surface Analysis of Nuclear Graphite
In recent times a wide variety of nanostructured carbon forms have been observed in nuclear graphite which vary the graphitic nature of the material... read more
AR-XPS at Environmental Conditions
Angle-resolved x-ray photoelectron spectroscopy (AR-XPS) can be used for non-destructive sample depth profiling... read more
High Pressure XPS
First results from the Scienta R4000 HiPP-3 high pressure analyser measuring on Ag under di-nitrogen pressure using the 0.8 mm first aperture of the instrument, which is optimized for pressures up to about 2 mbar... read more
Monochromatic XPS Performance with Insulating Polymeric Materials
In the analysis of polymeric surfaces with monochromatic sources offers a significant advantage over non-monochromatic sources... read more
Spectroscopic Analysis of Solid Oxide Fuel Cell Material with XPS
The elemental and chemical composition of the surface was investigated to determine the performance of the material under thermal cycling... read more
The detector allows the parallel acquisition of spin resolved and non-spin resolved data. The non spin resolved data is acquired with six standard channeltrons. The spin resolved data is measured using a mini-Mott polarimeter of the Rice university design... read more
HAXPES on the Beamline P09 at PETRA III
For revealing properties of bulk and interface structures, Hard X-ray Photoelectron Spectroscopy (HAXPES) is expected to be used increasingly in the near future, due to the decreased surface- and increased bulk sensitivity... read more
Rutherford Electron Backscattering at 15 keV
The elastic scattering of keV electrons can be used to determine the surface composition of relatively thick layers (up to 100 nm) in a way similar to ion scattering experiments... read more