Elmitec SPE-AC-LEEM Aberration-corrected
Focused Ion Beam
The unique Elmitec aberration-corrected SPELEEM is the most advanced and complete surface imaging system currently available. It combines record-breaking ultra-high lateral resolution with the most sophisticated LEEM and PEEM capabilities. Two beam-splitters are combined to transfer image and diffraction planes dispersion-free in the tetrode mirror. Distinctive calibration and tuning of the mirror make aberration correction even easier.