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Elmitec SPE-AC-LEEM Aberration-corrected

EM Resolution
< 2nm
EM Source
Tungsten
EDS
No
Focused Ion Beam
-
Type
LEEM
The unique Elmitec aberration-corrected SPELEEM is the most advanced and complete surface imaging system currently available. It combines record-breaking ultra-high lateral resolution with the most sophisticated LEEM and PEEM capabilities. Two beam-splitters are combined to transfer image and diffraction planes dispersion-free in the tetrode mirror. Distinctive calibration and tuning of the mirror make aberration correction even easier.

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