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FEI Talos F200X for Materials Science STEM

EM Resolution
0.12 nm line
EM Magnification
25x - 1.500.000x (TEM), 150x - 2.300.000x (STEM)
EM Acceleration Voltage
up to 200kV
EM Source
inquire
EDS
inquire
Focused Ion Beam
-
Type
TEM
Fastest 200 kV FEG STEM for chemical analysis in multiple dimensions
The FEI Talos F200X combines outstanding high-resolution scanning/transmission electron microscope (S/TEM) and TEM imaging with industry-leading energy dispersive x-ray spectroscopy (EDS) signal detection and 3D chemical characterization with compositional mapping. Talos F200X allows for the fastest and most precise EDS analysis in all dimensions (1D-4D), along with the best HRTEM imaging with fast navigation for dynamic microscopy. FEI Talos F200S does all this while also providing the highest stability and longest uptime.

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