FEI Tecnai Femto UEM for Materials Science TEM
EM Acceleration Voltage
Focused Ion Beam
4D dynamic electron microscopy at the atomic scale: To achieve full characterization of materials, including data relating to lifetime and morphology, requires the addition of the fourth dimension: time. Tecnai Femto ultrafast electron microscope (UEM) allows investigation of material structure and composition through observations of the material property changes influenced by applied stimulus. Tecnai Femto uses a pulse of electrons instead of a continuous electron beam. These pulses are generated by the external laser, with the laser pulse split into two beams. A time delay is introduced in order to determine the time reference event, allowing scientists to explore processes that occur at the atomic and molecular spatial scale over time spans measured in femtoseconds (10-15 seconds). For example: the absorption of light energy and its transformation into heat or mechanical changes (photoactuation); and the crystallization or recrystallization of materials, including large biological molecules, for structural analysis.