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FEI Teneo for Materials Science

EM Resolution
0.8 nm @ 30 kV (STEM)
EM Magnification
inquire
EM Acceleration Voltage
0.2 - 30kV
EM Source
Schottky thermal field emitter
EDS
Optional
Focused Ion Beam
-
Type
SEM
For metals researchers, academic and industrial research institutions, FEI's Teneo SEM provides Ultra High Resolution imaging together with the highest throughput analytical performance. A revolution in detection - the unique TrinityTM detection scheme delivers highest contrast on the widest range of samples for fastest imaging and easy interpretation of images. With three separate in-lens detectors operating simultaneously with the standard chamber detector, simultaneous detection from all angles can be performed, saving time, maximizing information and preventing sample contamination and damage.

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