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JEOL JCM-6000 NeoScope Benchtop SEM

EM Resolution
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EM Magnification
10x - 60.000x
EM Acceleration Voltage
5kV, 10kV, 15kV
EM Source
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EDS
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Focused Ion Beam
-
Type
SEM
The NeoScope benchtop SEM complements both optical microscopes and traditional SEMs in the lab, and can be configured for advanced analytical applications. This compact electron microscope is as simple to operate as a digital camera, but has the powerful electron optics of an SEM, with up to 60,000X magnification. The NeoScope makes it simple for any skill level of operator to obtain outstanding SEM images in less than three minutes from sample loading to imaging.

The microscope has a sleek new design with up-to-date features. Operation is via a touch screen, and is simplified with auto focus, auto alignment, auto contrast and auto brightness controls. The NeoScope operates in both low and high vacuum modes with three settings for accelerating voltage. These parameters are suitable for a variety of applications, all of which can be programmed in special pre-stored recipe files.

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