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JEOL JSM-6510LV High Performance SEM

EM Resolution
3.0nm @30kV High Vacuum Mode
EM Magnification
5x - 300.000x
EM Acceleration Voltage
0.5 kV to 30kV
EM Source
Tungsten, Lab6 optional
EDS
Optional
Focused Ion Beam
-
Type
SEM
The JSM-6510 series SEMs are high-performance, low cost, scanning electron microscopes for fast characterization on a wide variety of sample types. Offered in both high vacuum and low vacuum models, this SEM is widely-used in all research fields and industrial applications.

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