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JEOL JSM-7100FT Analytical FE SEM for magnetic to neuroscience samples

EM Resolution
1.2nm @ 30kV
EM Magnification
10x - 1.000.000x
EM Acceleration Voltage
10 kV - 30kV
EM Source
Schottky thermal field emitter
Focused Ion Beam
Analytical Field Emission SEM: The JSM-7100FT is a highly versatile, easy-to-use analytical field emission SEM that offers a new level of expanded performance to the budget-conscious lab. This high resolution SEM is ideal for both imaging and analysis of nanostructures, and determining chemical composition of the sample through X-ray spectroscopy. By combining large beam currents with a small probe size at ANY accelerating voltage, the JEOL JSM-7100FT dramatically increases analytical resolution to the sub 100nm scale.

From Magnetic to Neuroscience Samples: For the lab using multiple analytical techniques or requiring special capabilities, the JSM-7100FT is available with low vacuum operation (JSM-7100FT LV). The LV capability is suited for non-conductive samples and for enhanced high resolution imaging of nanostructures, specimen surface details, and magnetic samples.

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