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JEOL JSM-7610F Ultrahigh Resolution Analytical FE-SEM

EM Resolution
0.8nm @ 30kV
EM Magnification
25x- 1.000.000x
EM Acceleration Voltage
0.1 - 30kV
EM Source
Focused Ion Beam
Thermal, Analytical FE SEM: The JEOL JSM-7610F FEG-SEM combines two proven technologies – an electron column with semi-in-lens detectors and an in-the-lens Schottky field emission gun – to deliver ultrahigh resolution with wide range of probe currents for all applications (1pA to more than 200 nA). The JSM-7600F offers true 1,000,000X magnification with 1nm resolution and unmatched stability, making it possible to observe the fine surface morphology of nanostructures.

The JSM-7610F successfully integrates a full set of detectors for secondary electrons, backscattered electrons, EDS, WDS, EBSD, CL, and more. It is a top-of-the-line SEM for nanotechnology, material science, biology, cryo-microscopy, lithography, and compositional and structural analysis. The large specimen chamber accommodates a 200 mm diameter sample.

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