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JEOL JSM-IT300LV Versatile Research SEM

EM Resolution
3.0nm @30kV High Vacuum Mode
EM Magnification
5x - 300.000x
EM Acceleration Voltage
0.3 - 30kV
EM Source
Tungsten, Lab6 optional
EDS
Optional
Focused Ion Beam
-
Type
SEM
The JSM-IT300LV is the latest addition to JEOL's popular series of tungsten/LaB6 low vacuum SEMs. This all-new design builds upon the award-winning platform of the InTouchScope™ analytical SEM with intuitive touch screen control, and supersedes the widely used high-performance analytical SEM, the JSM-6610LV.

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