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TESCAN MIRA FEG-SEM LM

EM Resolution
1.2 nm @ 30 kV (SE, High Vacuum Mode))
EM Magnification
1x - 1.000.000x
EM Acceleration Voltage
0.2kV - 30 kV, 0.05 kV - 30 kV with BDT option
EM Source
Schottky thermal field emitter
EDS
Optional
Focused Ion Beam
-
Type
SEM
A fully PC controlled FE SEM intended for both – for high vacuum as well as for low vacuum operations. Outstanding optical properties, flicker-free digital image with super clarity. This generation of MIRA field emission scanning electron microscopes provides users with the advantages of the latest technology, such as new improved high-performance.
No of Ports: 11+ (depending on options)

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