We help scientists to compare scientific instruments
PDFPrint

TESCAN MIRA FEG-SEM XM

EM Resolution
1.2 nm @ 30 kV (SE, High Vacuum Mode))
EM Magnification
1x - 1.000.000x
EM Acceleration Voltage
0.2kV - 30 kV, 0.05 kV - 30 kV with BDT option
EM Source
Schottky thermal field emitter
EDS
Optional
Focused Ion Beam
-
Type
SEM
A fully PC controlled FE-SEM – for high vacuum as well as for low vacuum operations. Outstanding optical properties, flicker-free digital image with super clarity. Sophisticated user-friendly software for microscope control and image capturing using Windows™ platform. This generation of MIRA field emission scanning electron microscopes provides users with the advantages of the latest technology, such as new improved high-performance.
No of Ports: 12+ (depending on options)

ABOUT Science Duel Life

science.duel.life & mynexttool Is a Free-Access Scientific Instrument Database.

Accurate and truthful parameter filters for all instruments and manufacturers provide a positive experience to our users.

CONTACT

New York, NY

Berlin, Germany

CUSTOMER SUPPORT

Come back tomorrow for more.