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Gerneral Information

The electron microscope is a type of microscope that uses a beam of electrons to create an image of the specimen. It is capable of much higher magnifications and has a greater resolving power than a light microscope, allowing it to see much smaller objects in finer detail.

 

Because the wavelength of an electron can be up to 100.000 times shorter than that of visible light photons, the electron microscope has a higher resolving power than a light microscope and can reveal the structure of smaller objects. A transmission electron microscope can achieve better than 50 pm resolution and magnifications of up to about 10.000.000 x.

The transmission electron microscope uses electrostatic and electromagnetic lenses to control the electron beam and focus it to form an image. These electron optical lenses are analogous to the glass lenses of an optical light microscope.

Electron microscopes are used to investigate the ultrastructure of a wide range of biological and inorganic specimens including microorganisms, cells, large molecules, biopsy samples, metals, and crystals. Industrially, the electron microscope is often used for quality control and failure analysis. Modern electron microscopes produce electron micrographs using specialized digital cameras and frame grabbers to capture the image.

Read more here: What is Electron Microscopy? - John Innes Centre

Here is a market overview of instruments made by specialist manufacturers and companies around the globe.

Results 73 - 96 of 120
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Electron Microscopes

Hitachi NB5000 nanoDUE'T FIB-SEM

The HITACHI NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM.

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FEI Verios XHR SEM for Materials Science

The best possible low-kV SEM resolution and materials contrast: Verios enables new insights by extending sub-nanometer resolution over the full 500...

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Zeiss EVO MA10

Put your EVO to work on a wide range of material samples. Capture outstanding topographical details at low voltages with beam deceleration and high...

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Elmitec SPE-AC-LEEM Aberration-corrected

The unique Elmitec aberration-corrected SPELEEM is the most advanced and complete surface imaging system currently available. It combines...

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TESCAN VEGA3 LM

A fully PC controlled SEM with conventional tungsten heated cathode intended for both - for high vacuum as well as for low vacuum operations. No of...

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FEI Tecnai Femto UEM for Materials Science TEM

4D dynamic electron microscopy at the atomic scale: To achieve full characterization of materials, including data relating to lifetime and...

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Zeiss SIGMA VP for Life Sciences

SIGMA VP offers many advantages for life science applications. The high purity, in-lens, SE detection allows true surface imaging for crisp images of...

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Zeiss EVO LS25

Put your EVO to work on a wide range of material samples. Capture outstanding topographical details at low voltages with beam deceleration and high...

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TESCAN LYRA3 XM

A fully PC controlled SEM with Schottky field emission cathode in combination with gallium Focused Ion Beam (FIB) column and optionally with Gas...

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JEOL JSM-6510LV High Performance SEM

The JSM-6510 series SEMs are high-performance, low cost, scanning electron microscopes for fast characterization on a wide variety of sample types....

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Hitachi SU5000 Schottky FE-SEM with Revolutionary SEM Control

The SU5000 has forever changed SEM operation. Ground-breaking computer-assisted technology from Hitachi, referred to as the EM Wizard, offers a new...

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Hitachi H-9500 300kV TEM

The H-9500 300 kV transmission electron microscope is designed to support research on solid state materials and polymeric materials. The H-9500 300...

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FEI Helios Nanolab G3 CX

With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for SEM/TEM, and the most precise prototyping capabilities,...

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FEI QEMSCAN

QEMSCAN is a fully automated, non-destructive, micro-analysis system that provides rapid, statistically reliable and repeatable, mineralogical,...

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Phenom Pure Desktop SEM

The Phenom Pure desktop scanning electron microscope (SEM) is an ideal tool for making the transition from working with a light microscope to...

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SPECS FE-LEEM P90 AC

Low Energy Electron Microscope with unsurpassed ultimate resolution of 2.0nm achieved with SPECS FE-LEEM P90 with Aberration Corrector

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FEI Talos F200X for Materials Science STEM

Fastest 200 kV FEG STEM for chemical analysis in multiple dimensions The FEI Talos F200X combines outstanding high-resolution scanning/transmission...

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Zeiss MERLIN VP Compact

From Imaging to Multipurpose Nano-analysis Lab for Challenging Research Activities. MERLIN VP Compact with the proven GEMINI I electron column enable...

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Zeiss GeminiSEM 300

Effortless imaging - get sub-nanometer resolution and high detection efficiency, even in variable pressure mode - feel like you’re working in high...

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TESCAN MIRA FEG-SEM XM

A fully PC controlled FE-SEM – for high vacuum as well as for low vacuum operations. Outstanding optical properties, flicker-free digital image with...

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FEI Helios Nanolab G3 UC

With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for SEM/TEM, and the most precise prototyping capabilities,...

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Hitachi SU8010 UHR Cold-Emission FE-SEM

Entry-level model with Lower in-chamber/Upper in-lens (Dual) electron detectors..High-performance cold-field emission SEM for the nanotechnology...

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Hitachi S-3700N Ultra Large VP-SEM

S-3700N Ultra Large VP-SEM has a specimen chamber that can handle specimen size up to 300mm in diameter and 110 mm in height at analytical working...

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FEI Titan Themis 300 for Materials Science

Titan ETEM G2 combines both standard TEM and dedicated environmental TEM capabilities, thereby designed as a fully integrated platform for in situ...

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