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Gerneral Information

The electron microscope is a type of microscope that uses a beam of electrons to create an image of the specimen. It is capable of much higher magnifications and has a greater resolving power than a light microscope, allowing it to see much smaller objects in finer detail.

 

Because the wavelength of an electron can be up to 100.000 times shorter than that of visible light photons, the electron microscope has a higher resolving power than a light microscope and can reveal the structure of smaller objects. A transmission electron microscope can achieve better than 50 pm resolution and magnifications of up to about 10.000.000 x.

The transmission electron microscope uses electrostatic and electromagnetic lenses to control the electron beam and focus it to form an image. These electron optical lenses are analogous to the glass lenses of an optical light microscope.

Electron microscopes are used to investigate the ultrastructure of a wide range of biological and inorganic specimens including microorganisms, cells, large molecules, biopsy samples, metals, and crystals. Industrially, the electron microscope is often used for quality control and failure analysis. Modern electron microscopes produce electron micrographs using specialized digital cameras and frame grabbers to capture the image.

Read more here: What is Electron Microscopy? - John Innes Centre

Here is a market overview of instruments made by specialist manufacturers and companies around the globe.

Results 97 - 120 of 120
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Electron Microscopes

Zeiss SIGMA 300

The SIGMA Series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy. Equipped with the GEMINI column...

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Zeiss EVO MA25

Put your EVO to work on a wide range of material samples. Capture outstanding topographical details at low voltages with beam deceleration and high...

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TESCAN LYRA3 GM

A fully PC controlled SEM with Schottky field emission cathode in combination with gallium Focused Ion Beam (FIB) column and optionally with Gas...

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JEOL JSM-IT300LV Versatile Research SEM

The JSM-IT300LV is the latest addition to JEOL's popular series of tungsten/LaB6 low vacuum SEMs. This all-new design builds upon the award-winning...

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Hitachi SU9000 UHR FE-SEM

The SU9000 is HITACHI's premium UHR FE-SEM. It features unique electron optics, with the sample positioned inside a gap of the split objective lens...

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Hitachi TM3030PLUS Tabletop Microscope

The Hitachi TM3030Plus Tabletop SEM is equipped with a proprietary, highly sensitive low-vacuum secondary electron detector capable of revealing fine...

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FEI Magellan XHR 400L FE-SEM

Magellan XHR 400L FE-SEM (sales closed) Alternative: Verios XHR SEM

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FEI Inspect F50

Inspect F50’s user interface is simple and easy to learn, yet flexible enough for the challenges of complex environments where individual research...

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JEOL JIB-4501

The JIB-4501 focused ion beam system is a state-of-the-art, high-resolution, digital 2-beam focused ion beam system with newly designed ion optics,...

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SPECS FE-LEEM P90

Low-Energy Electron Microscope: The SPECS LEEM instrument FE-LEEM P90 is a next generation Low Energy Electron Microscope with unsurpassed 5 nm...

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FEI Titan Halo for Life Sciences TEM

From live observation of focused high-intensity beams to low-dose applications and diffraction: The Titan Halo transmission electron microscope (TEM)...

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Zeiss MERLIN Compact for Materials

From Imaging to Multipurpose Nano-analysis Lab for Challenging Research Activities. MERLIN Compact and MERLIN VP Compact with the proven GEMINI I...

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Zeiss SIGMA 500

The SIGMA Series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy. Equipped with the GEMINI column...

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TESCAN MIRA FEG-SEM LM

A fully PC controlled FE SEM intended for both – for high vacuum as well as for low vacuum operations. Outstanding optical properties, flicker-free...

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FEI Metrios TEM for Electronics

The first TEM dedicated to the semiconductor industry: The Metrios system is the first TEM dedicated to providing the fast, precise measurements that...

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Hitachi SU-70 UHR Schottky (Analytical) FE-SEM

A field-emission SEM designed to perform ultra-high resolution imaging together with various analytical functions. The SU-70 is a new-concept SEM,...

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FEI Titan Themis 200 for Materials Science

Titan ETEM G2 combines both standard TEM and dedicated environmental TEM capabilities, thereby designed as a fully integrated platform for in situ...

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FEI Teneo for Materials Science

For metals researchers, academic and industrial research institutions, FEI's Teneo SEM provides Ultra High Resolution imaging together with the...

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JEOL JSM-7610F Ultrahigh Resolution Analytical FE-SEM

Thermal, Analytical FE SEM: The JEOL JSM-7610F FEG-SEM combines two proven technologies – an electron column with semi-in-lens detectors and an...

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Hitachi SU8220 Ultimate Cold Field Emission SEM

The 8220 -Standard stage model- employs a novel cold field emission (CFE) gun for improved imaging and analytical performance. The newly designed...

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Hitachi HD-2700 Cs-Corrected FE-STEM

Spherical Aberration Corrected Scanning Transmission Electron Microscope: The incomparable HD-2700 dedicated STEM features the Hitachi developed...

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FEI Helios PFIB EFI

DualBeam Plasma FIB platform for semiconductor failure analysis, process development and process control applications. With fully-integrated SEM and...

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FEI Teneo VS SEM for Life Sciences

Highest quality isotropic 3D data from large sample volumes: Teneo VS is geared toward increasing publishable results from your lab. While enabling...

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Phenom ProX Desktop SEM

The Phenom ProX desktop scanning electron microscope (SEM) is the ultimate all-in-one imaging and X-ray analysis system. With the Phenom ProX ,...

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