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Gerneral Information

The electron microscope is a type of microscope that uses a beam of electrons to create an image of the specimen. It is capable of much higher magnifications and has a greater resolving power than a light microscope, allowing it to see much smaller objects in finer detail.

 

Because the wavelength of an electron can be up to 100.000 times shorter than that of visible light photons, the electron microscope has a higher resolving power than a light microscope and can reveal the structure of smaller objects. A transmission electron microscope can achieve better than 50 pm resolution and magnifications of up to about 10.000.000 x.

The transmission electron microscope uses electrostatic and electromagnetic lenses to control the electron beam and focus it to form an image. These electron optical lenses are analogous to the glass lenses of an optical light microscope.

Electron microscopes are used to investigate the ultrastructure of a wide range of biological and inorganic specimens including microorganisms, cells, large molecules, biopsy samples, metals, and crystals. Industrially, the electron microscope is often used for quality control and failure analysis. Modern electron microscopes produce electron micrographs using specialized digital cameras and frame grabbers to capture the image.

Read more here: What is Electron Microscopy? - John Innes Centre

Here is a market overview of instruments made by specialist manufacturers and companies around the globe.

Results 1 - 24 of 120
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Electron Microscopes

TESCAN MIRA FEG-SEM GM

A fully PC controlled high resolution FE-SEM intended for both - for high vacuum as well as for low vacuum operations. Outstanding electron-optical...

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FEI Teneo VS SEM for Life Sciences

Highest quality isotropic 3D data from large sample volumes: Teneo VS is geared toward increasing publishable results from your lab. While enabling...

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FEI Scios DualBeam

FEI Scios is an ultra-high-resolution analytical DualBeam system that delivers outstanding 2D and 3D performance for a broad range of samples,...

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Phenom ProX Desktop SEM

The Phenom ProX desktop scanning electron microscope (SEM) is the ultimate all-in-one imaging and X-ray analysis system. With the Phenom ProX ,...

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Hitachi SU8020 UHR Cold-Emission FE-SEM

Lower/Upper/Top (Triple) electron detectors for extended secondary and low energy backscattered electron collection ability. This novel,...

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Hitachi HD-2700 Cs-Corrected FE-STEM

Spherical Aberration Corrected Scanning Transmission Electron Microscope: The incomparable HD-2700 dedicated STEM features the Hitachi developed...

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Zeiss EVO LS10

Put your EVO to work on a wide range of material samples. Capture outstanding topographical details at low voltages with beam deceleration and high...

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FEI Helios PFIB EFI

DualBeam Plasma FIB platform for semiconductor failure analysis, process development and process control applications. With fully-integrated SEM and...

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TESCAN TIMA LM or GM

The TESCAN Integrated Mineral Analyzer (TIMA) is a SEM-based automated mineralogy solution for the mining and minerals processing industries.

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FEI Verios XHR SEM for Electronics

The best possible low-kV SEM resolution and materials contrast: Verios is geared toward increasing publishable results from your lab. In the...

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FEI Versa 3D DualBeam

Building on the history and success of FEI's pioneering DualBeam, low vacuum and ESEM™ expertise, FEI introduces the most versatile DualBeam...

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Zeiss EVO Life Science

Put EVO to work on a wide range of life science samples. Capture outstanding topographical details at low voltages with beam deceleration and high...

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Hitachi SU8030 UHR Cold-Emission FE-SEM

Large chamber/large stage model for large or multiple samples, featuring the same Triple signal detecting system like the SU8020. High-performance...

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Hitachi HT7700 120kV High-Contrast/High-Resolution Digital TEM

The Hitachi Model HT7700 120kV High-Contrast/High-Resolution Digital TEM provides maximum performance and productivity for biological and material...

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Zeiss EVO LS15

Put your EVO to work on a wide range of material samples. Capture outstanding topographical details at low voltages with beam deceleration and high...

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TESCAN MAIA3 XM / LM / GM

MAIA3 from TESCAN is a newly developed analytical scanning electron microscope which demonstrates ultra-high resolution of 1 nm at 15 kV. The...

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FEI Verios XHR SEM for Materials Science

The best possible low-kV SEM resolution and materials contrast: Verios enables new insights by extending sub-nanometer resolution over the full 500...

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FEI ExSolve Wafer TEM Prep

ExSolve is an automated, high-throughput sample preparation workflow for transmission electron microscopy (TEM) analysis. The ExSolve wafer TEM prep...

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Zeiss EVO MA10

Put your EVO to work on a wide range of material samples. Capture outstanding topographical details at low voltages with beam deceleration and high...

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Hitachi SU8040 UHR Cold-Emission FE-SEM

Top of the SU8000 family, the SU8040 combines the Triple detection system with the high-performance ‘Regulus’ stage for ultra-smooth and...

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Hitachi NB5000 nanoDUE'T FIB-SEM

The HITACHI NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM.

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Zeiss EVO MA15

Put your EVO to work on a wide range of material samples. Capture outstanding topographical details at low voltages with beam deceleration and high...

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TESCAN LYRA3 GM

A fully PC controlled SEM with Schottky field emission cathode in combination with gallium Focused Ion Beam (FIB) column and optionally with Gas...

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FEI Titan ETEM G2 for Materials Science

Titan ETEM G2 combines both standard TEM and dedicated environmental TEM capabilities, thereby designed as a fully integrated platform for in situ...

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