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Gerneral Information

The electron microscope is a type of microscope that uses a beam of electrons to create an image of the specimen. It is capable of much higher magnifications and has a greater resolving power than a light microscope, allowing it to see much smaller objects in finer detail.

 

Because the wavelength of an electron can be up to 100.000 times shorter than that of visible light photons, the electron microscope has a higher resolving power than a light microscope and can reveal the structure of smaller objects. A transmission electron microscope can achieve better than 50 pm resolution and magnifications of up to about 10.000.000 x.

The transmission electron microscope uses electrostatic and electromagnetic lenses to control the electron beam and focus it to form an image. These electron optical lenses are analogous to the glass lenses of an optical light microscope.

Electron microscopes are used to investigate the ultrastructure of a wide range of biological and inorganic specimens including microorganisms, cells, large molecules, biopsy samples, metals, and crystals. Industrially, the electron microscope is often used for quality control and failure analysis. Modern electron microscopes produce electron micrographs using specialized digital cameras and frame grabbers to capture the image.

Read more here: What is Electron Microscopy? - John Innes Centre

Here is a market overview of instruments made by specialist manufacturers and companies around the globe.

Results 1 - 24 of 39
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FEI

FEI Quanta 250 FEG-SEM

Quanta line includes six variable-pressure and environmental scanning electron microscopes (ESEM). All of which can accommodate multiple sample and...

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FEI Helios PFIB EFI

DualBeam Plasma FIB platform for semiconductor failure analysis, process development and process control applications. With fully-integrated SEM and...

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FEI Titan ETEM G2 for Materials Science

Titan ETEM G2 combines both standard TEM and dedicated environmental TEM capabilities, thereby designed as a fully integrated platform for in situ...

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FEI Tecnai iCorr for Life Sciences

Correlative Light and Electron Microscopy (CLEM) experiments are challenging due to the differences in orientation, contrast, and scaling of FM and...

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FEI Scios DualBeam

FEI Scios is an ultra-high-resolution analytical DualBeam system that delivers outstanding 2D and 3D performance for a broad range of samples,...

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FEI Morgagni (sale closed)

FEI TEM Model (no longer sold)

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FEI Aspex Extreme

The Aspex Extreme for Industrial Manufacturing is an elemental analyzer that provides the power of a competitive SEM but in a self-contained package...

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FEI Talos F200S for Materials Science STEM

Standard for uncorrected STEM performance: The FEI Talos F200S combines outstanding high-resolution scanning/transmission electron microscope (STEM)...

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FEI Tecnai G2 20 TEM

The Tecnai G2 transmission electron microscope unifies fast, efficient and easy operation with proven reliability to serve many applications needs –...

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FEI Quanta 250 SEM

Quanta line includes six variable-pressure and environmental scanning electron microscopes (ESEM™). All of which can accommodate multiple sample and...

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FEI Helios PFIB DualBeam for Materials Science

The Helios PFIB DualBeam features FEI's most recent advances in Plasma Focused Ion Beam and field emission SEM (FESEM) technologies and their...

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FEI Verios XHR SEM for Materials Science

The best possible low-kV SEM resolution and materials contrast: Verios enables new insights by extending sub-nanometer resolution over the full 500...

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FEI Tecnai Femto UEM for Materials Science TEM

4D dynamic electron microscopy at the atomic scale: To achieve full characterization of materials, including data relating to lifetime and...

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FEI Helios Nanolab G3 UC

With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for SEM/TEM, and the most precise prototyping capabilities,...

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FEI Verios XHR SEM for Life Sciences

The best possible low-kV SEM resolution and materials contrast: Verios is geared toward increasing publishable results from your lab. In the...

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FEI QEMSCAN

QEMSCAN is a fully automated, non-destructive, micro-analysis system that provides rapid, statistically reliable and repeatable, mineralogical,...

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FEI Talos F200X for Materials Science STEM

Fastest 200 kV FEG STEM for chemical analysis in multiple dimensions The FEI Talos F200X combines outstanding high-resolution scanning/transmission...

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FEI ExSolve Wafer TEM Prep

ExSolve is an automated, high-throughput sample preparation workflow for transmission electron microscopy (TEM) analysis. The ExSolve wafer TEM prep...

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FEI Nova NanoSEM 450 / 650

The Nova NanoSEM™ scanning electron microscope delivers best in class imaging and analytical performance in a single, easy-to-use instrument....

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FEI Helios Nanolab G3 CX

With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for SEM/TEM, and the most precise prototyping capabilities,...

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FEI Verios XHR SEM for Electronics

The best possible low-kV SEM resolution and materials contrast: Verios is geared toward increasing publishable results from your lab. In the...

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FEI Tecnai G2 F30 for Materials Science TEM

The Tecnai G2 transmission electron microscope unifies fast, efficient and easy operation with proven reliability to serve many applications needs –...

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FEI Titan Themis 300 for Materials Science

Titan ETEM G2 combines both standard TEM and dedicated environmental TEM capabilities, thereby designed as a fully integrated platform for in situ...

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FEI Inspect F50

Inspect F50’s user interface is simple and easy to learn, yet flexible enough for the challenges of complex environments where individual research...

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