Gaertner Scientific Multiwavelength L2W
405, 544, 633, 830 nm (2 Lasers allowed)
Manually or Auto
The Two Wavelength Ellipsometers use additional laser sources to analyze difficult films. They give refractive index results in near period regions, and measure the thickness of thicker films, and offer many of the advantages of spectroscopic ellipsometers without the complexity. Priced from $35K in the USA.