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Gaertner Scientific Two Angle Two Wave Stokes Waferskan LSE-WS2A2W

Elli Type
Laser Ellipsometer
Elli Wavelenght
544, 633 nm
Elli Imaging
Elli Spectroscopy
Elli Alignment
High speed film thickness mapping system automatically measures each site at 70° with a red laser and 60° incident angle with a green laser. It is a fast instrument for thin film visualization giving tilt-free, focus-free, automatic 2D/3D color thickness and index images on wafers up to 300mm.

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