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Gaertner Scientific Stokes WAFERSKAN Ellipsometer LSE-WS

Elli Type
Laser Ellipsometer
Elli Wavelenght
632,8 nm
Elli Imaging
Elli Spectroscopy
Elli Alignment
Elli Spare Field
< 50k US$ (US price)
High speed film thickness mapping system measuring one site per second including stage travel! It uses advanced StokesMeter™ technology to give tilt-free, focus free, 2D/3D color thickness and index maps on any size wafer up to 300mm. Easy to use and affordably priced under $50K in the USA, the LSE-WS is a outstanding value in a high precision scanning ellipsometer.

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