Metricon Model 2010/M Prism Coupler
Prism Coupler Laser Ellipsometry-like
633 nm, optional 405, 450, 473, 532, 594 nm
Compared to instruments based on optical interference, ellipsometry, or Abbe refractometry, the 2010/M’s prism coupling technology provides unmatched index accuracy/resolution, and minimal sample preparation is required. The system also measures dispersion, index gradients, dn/dT, and loss of optical waveguides.