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SCI FilmTek SE

Elli Type
Spectroscopic
Elli Wavelenght
190 - 1700 nm
Elli Imaging
Mapping
Elli Spectroscopy
Elli Alignment
Manually or Auto
The FilmTek SE is a high performance spectroscopic ellipsometer for thin film characterization that measures from the deep UV to NIR (190 - 1700 nm).

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