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SENTECH CER SE 500adv

Elli Type
Laser Ellipsometer
Elli Imaging
Mapping
Elli Spectroscopy
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Combined Ellipsometry Reflectometry:
The combination of ellipsometry and reflectometry allows for fast and unambiguous determination of the thickness of transparent films by automatic identifcation of the cyclic thickness period.
Largest measurement range
The combination of laser ellipsometer and reflectometry extends the thickness range for transparent films up to 25 µm and more depending on photometer option.

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