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SENTECH SE 400adv

Elli Type
Laser Ellipsometer
Elli Imaging
Mapping
Elli Spectroscopy
-
Elli Alignment
40 ° - 90 °
Multiple angle laser ellipsometer:
The SE 400adv is the SENTECH laser ellipsometer for thickness measurement of ultra thin single films. The compact table top instrument comprises the ellipsometer optics, goniometer, sample platform, auto-collimation telescope, HeNe laser source, and detection unit. The options of our laser ellipsometer SE 400adv support applications in microelectronic, photovoltaic, data storage, display technology, life science, metal processing, and others.

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