Select any of the instruments below. To compare, check the "Compare" check box of two or more instruments and click "Compare".
Focused ion beam (FIB), is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. An FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, an FIB setup uses a focused beam of ions instead. FIB can also be incorporated in a system with both electron and ion beam columns, allowing the same feature to be investigated using either of the beams.
Here is a market overview of instruments made by specialist manufacturers and companies around the globe.
FIB Focused Ion Beam