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FEI Scios DualBeam

EM Resolution
1.0 @ 30 kV
EM Magnification
40x - 1.280.000x
EM Acceleration Voltage
0.2 - 30kV
EM Source
Schottky thermal field emitter
EDS
Optional
Focused Ion Beam
Type
FIB-SEM
Ion Gun
Ga Liquid Metal Ion Source
FIB Resolution
5 nm (statistical method)
FIB Acceleration Voltage
0.5 - 30 kV
FEI Scios is an ultra-high-resolution analytical DualBeam system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With innovative features designed to increase throughput, precision, and ease of use, the FEI Scios is ideal for advanced research and analysis across academic, government, and industrial research environments.

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