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JEOL JIB-4000 Single Beam FIB

Ion Gun
Ga liquid metal ion
FIB Resolution
5 nm @ 30 kV
FIB Acceleration Voltage
1kV - 30kV
The JIB-4000 focused ion beam system is a state-of-the-art, high-resolution, digital focused ion beam system with newly designed ion optics and an intuitive, graphic user interface (GUI). The JIB-4000 can be used to produce thin film cuts for STEM/TEM analyses as well as specimen cross sections for SEM analyses based on very different materials which would otherwise be difficult, if not impossible, to prepare. The imaging and the material removal are performed using a single ion column, which provides superb accuracy for target preparations.

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