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ZEISS Crossbeam 340

EM Resolution
1.0 nm @ 15 kV
EM Magnification
inquire
EM Acceleration Voltage
inquire
EM Source
Schottky thermal field emitter
EDS
Optional
Focused Ion Beam
Type
FIB-SEM
Ion Gun
Ga Liquid Metal Ion Source
FIB Resolution
< 3 nm (statistical method)
FIB Acceleration Voltage
inquire
Crossbeam 340 with GEMINI I VP
Profit from maximum sample flexibility in multi-purpose environments.
Perform in situ experiments with outgassing or charging samples.
Get the unique GEMINI material contrast with the optional Inlens Duo detector.

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