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Gerneral Information

Focused ion beam (FIB), is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. An FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, an FIB setup uses a focused beam of ions instead. FIB can also be incorporated in a system with both electron and ion beam columns, allowing the same feature to be investigated using either of the beams.

Here is a market overview of instruments made by specialist manufacturers and companies around the globe.

 

Results 1 - 9 of 9

FIB Focused Ion Beam

FEI Helios PFIB EFI

DualBeam Plasma FIB platform for semiconductor failure analysis, process development and process control applications. With fully-integrated SEM and...

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FEI Vion Plasma Focused Ion Beam

The FEI Vion™ Plasma Focused Ion Beam System (PFIB) adds significantly more capacity to your lab, with best-in-class milling and imaging performance...

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FEI Helios PFIB DualBeam for Materials Science

The Helios PFIB DualBeam features FEI's most recent advances in Plasma Focused Ion Beam and field emission SEM (FESEM) technologies and their...

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FEI Versa 3D DualBeam

Building on the history and success of FEI's pioneering DualBeam, low vacuum and ESEM™ expertise, FEI introduces the most versatile DualBeam...

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FEI Helios Nanolab G3 CX

With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for SEM/TEM, and the most precise prototyping capabilities,...

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FEI Scios DualBeam

FEI Scios is an ultra-high-resolution analytical DualBeam system that delivers outstanding 2D and 3D performance for a broad range of samples,...

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FEI ExSolve Wafer TEM Prep

ExSolve is an automated, high-throughput sample preparation workflow for transmission electron microscopy (TEM) analysis. The ExSolve wafer TEM prep...

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FEI Helios Nanolab G3 UC

With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for SEM/TEM, and the most precise prototyping capabilities,...

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FEI V400ACE Focused Ion Beam

The V400ACE is specifically designed to meet the challenges of advanced designs and processes: smaller geometries, higher circuit densities, exotic...

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