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Gerneral Information

Focused ion beam (FIB), is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. An FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, an FIB setup uses a focused beam of ions instead. FIB can also be incorporated in a system with both electron and ion beam columns, allowing the same feature to be investigated using either of the beams.

Here is a market overview of instruments made by specialist manufacturers and companies around the globe.

 

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FIB Focused Ion Beam

Hitachi NB5000 nanoDUE'T FIB-SEM

The HITACHI NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM.

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Hitachi FB2200 Focused Ion Beam System

The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other...

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