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Gerneral Information

Focused ion beam (FIB), is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. An FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, an FIB setup uses a focused beam of ions instead. FIB can also be incorporated in a system with both electron and ion beam columns, allowing the same feature to be investigated using either of the beams.

Here is a market overview of instruments made by specialist manufacturers and companies around the globe.

 

Results 1 - 4 of 4

FIB Focused Ion Beam

TESCAN FERA3 XM

Fully controlled SEM with Schottky field emission cathode in combination with Xe Plasma Focused Ion Beam (i-FIB) column and optionally with Gas...

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TESCAN FERA3 GM

PC controlled SEM with Schottky field emission cathode in combination with Xe Plasma Focused Ion Beam (i-FIB) column and optionally with Gas...

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TESCAN LYRA3 GM

A fully PC controlled SEM with Schottky field emission cathode in combination with gallium Focused Ion Beam (FIB) column and optionally with Gas...

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TESCAN LYRA3 XM

A fully PC controlled SEM with Schottky field emission cathode in combination with gallium Focused Ion Beam (FIB) column and optionally with Gas...

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