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Gerneral Information

Focused ion beam (FIB), is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. An FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, an FIB setup uses a focused beam of ions instead. FIB can also be incorporated in a system with both electron and ion beam columns, allowing the same feature to be investigated using either of the beams.

Here is a market overview of instruments made by specialist manufacturers and companies around the globe.

 

Results 1 - 4 of 4

FIB Focused Ion Beam

Zeiss Crossbeam 540

Crossbeam 540 with GEMINI II Get high resolution even at low voltage and high current thanks to the double condenser system. Gain more information...

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ZEISS Crossbeam 340

Crossbeam 340 with GEMINI I VP Profit from maximum sample flexibility in multi-purpose environments. Perform in situ experiments with outgassing or...

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Zeiss Auriga /40 /60

Sales Closed. Replaced by Zeiss Crossbeam Line.

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ZEISS ORION NanoFab Multiple Ion Beam Micrsocope

3-in-1 Multibeam Ion Microscope for Sub-10nm Nanostructuring. Fabricate sub-10nm nanostructures with speed and precision. Seamlessly switch between...

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