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Gerneral Information

Focused ion beam (FIB), is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. An FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, an FIB setup uses a focused beam of ions instead. FIB can also be incorporated in a system with both electron and ion beam columns, allowing the same feature to be investigated using either of the beams.

Here is a market overview of instruments made by specialist manufacturers and companies around the globe.

 

Results 1 - 5 of 5

FIB Focused Ion Beam

FEI Vion Plasma Focused Ion Beam

The FEI Vion™ Plasma Focused Ion Beam System (PFIB) adds significantly more capacity to your lab, with best-in-class milling and imaging performance...

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ZEISS ORION NanoFab Multiple Ion Beam Micrsocope

3-in-1 Multibeam Ion Microscope for Sub-10nm Nanostructuring. Fabricate sub-10nm nanostructures with speed and precision. Seamlessly switch between...

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JEOL JIB-4000 Single Beam FIB

The JIB-4000 focused ion beam system is a state-of-the-art, high-resolution, digital focused ion beam system with newly designed ion optics and an...

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Hitachi FB2200 Focused Ion Beam System

The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other...

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FEI V400ACE Focused Ion Beam

The V400ACE is specifically designed to meet the challenges of advanced designs and processes: smaller geometries, higher circuit densities, exotic...

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