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Gerneral Information

Focused ion beam (FIB), is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. An FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, an FIB setup uses a focused beam of ions instead. FIB can also be incorporated in a system with both electron and ion beam columns, allowing the same feature to be investigated using either of the beams.

Here is a market overview of instruments made by specialist manufacturers and companies around the globe.


Results 1 - 5 of 5

FIB Focused Ion Beam

JEOL JIB-4000 Single Beam FIB

The JIB-4000 focused ion beam system is a state-of-the-art, high-resolution, digital focused ion beam system with newly designed ion optics and an...


Hitachi FB2200 Focused Ion Beam System

The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other...


FEI V400ACE Focused Ion Beam

The V400ACE is specifically designed to meet the challenges of advanced designs and processes: smaller geometries, higher circuit densities, exotic...


FEI Vion Plasma Focused Ion Beam

The FEI Vion™ Plasma Focused Ion Beam System (PFIB) adds significantly more capacity to your lab, with best-in-class milling and imaging performance...


ZEISS ORION NanoFab Multiple Ion Beam Micrsocope

3-in-1 Multibeam Ion Microscope for Sub-10nm Nanostructuring. Fabricate sub-10nm nanostructures with speed and precision. Seamlessly switch between...


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