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Gerneral Information

Focused ion beam (FIB), is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. An FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, an FIB setup uses a focused beam of ions instead. FIB can also be incorporated in a system with both electron and ion beam columns, allowing the same feature to be investigated using either of the beams.

Here is a market overview of instruments made by specialist manufacturers and companies around the globe.

 

Results 1 - 22 of 22

FIB Focused Ion Beam

FEI Versa 3D DualBeam

Building on the history and success of FEI's pioneering DualBeam, low vacuum and ESEM™ expertise, FEI introduces the most versatile DualBeam...

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JEOL JIB-4601F

The JIB-4601F focused ion beam system is a state-of-the-art, high-resolution, digital 2-beam focused ion beam system with newly designed ion optics,...

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Zeiss Auriga /40 /60

Sales Closed. Replaced by Zeiss Crossbeam Line.

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Hitachi NB5000 nanoDUE'T FIB-SEM

The HITACHI NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM.

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TESCAN FERA3 XM

Fully controlled SEM with Schottky field emission cathode in combination with Xe Plasma Focused Ion Beam (i-FIB) column and optionally with Gas...

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FEI Scios DualBeam

FEI Scios is an ultra-high-resolution analytical DualBeam system that delivers outstanding 2D and 3D performance for a broad range of samples,...

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JEOL JIB-4501

The JIB-4501 focused ion beam system is a state-of-the-art, high-resolution, digital 2-beam focused ion beam system with newly designed ion optics,...

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FEI Helios PFIB DualBeam for Materials Science

The Helios PFIB DualBeam features FEI's most recent advances in Plasma Focused Ion Beam and field emission SEM (FESEM) technologies and their...

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Hitachi FB2200 Focused Ion Beam System

The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other...

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TESCAN FERA3 GM

PC controlled SEM with Schottky field emission cathode in combination with Xe Plasma Focused Ion Beam (i-FIB) column and optionally with Gas...

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FEI Helios Nanolab G3 UC

With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for SEM/TEM, and the most precise prototyping capabilities,...

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JEOL JIB-4000 Single Beam FIB

The JIB-4000 focused ion beam system is a state-of-the-art, high-resolution, digital focused ion beam system with newly designed ion optics and an...

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FEI Helios Nanolab G3 CX

With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for SEM/TEM, and the most precise prototyping capabilities,...

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FEI V400ACE Focused Ion Beam

The V400ACE is specifically designed to meet the challenges of advanced designs and processes: smaller geometries, higher circuit densities, exotic...

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TESCAN LYRA3 GM

A fully PC controlled SEM with Schottky field emission cathode in combination with gallium Focused Ion Beam (FIB) column and optionally with Gas...

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Zeiss Crossbeam 540

Crossbeam 540 with GEMINI II Get high resolution even at low voltage and high current thanks to the double condenser system. Gain more information...

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FEI ExSolve Wafer TEM Prep

ExSolve is an automated, high-throughput sample preparation workflow for transmission electron microscopy (TEM) analysis. The ExSolve wafer TEM prep...

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FEI Vion Plasma Focused Ion Beam

The FEI Vion™ Plasma Focused Ion Beam System (PFIB) adds significantly more capacity to your lab, with best-in-class milling and imaging performance...

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TESCAN LYRA3 XM

A fully PC controlled SEM with Schottky field emission cathode in combination with gallium Focused Ion Beam (FIB) column and optionally with Gas...

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FEI Helios PFIB EFI

DualBeam Plasma FIB platform for semiconductor failure analysis, process development and process control applications. With fully-integrated SEM and...

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ZEISS Crossbeam 340

Crossbeam 340 with GEMINI I VP Profit from maximum sample flexibility in multi-purpose environments. Perform in situ experiments with outgassing or...

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ZEISS ORION NanoFab Multiple Ion Beam Micrsocope

3-in-1 Multibeam Ion Microscope for Sub-10nm Nanostructuring. Fabricate sub-10nm nanostructures with speed and precision. Seamlessly switch between...

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