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Gerneral Information

Focused ion beam (FIB), is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. An FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, an FIB setup uses a focused beam of ions instead. FIB can also be incorporated in a system with both electron and ion beam columns, allowing the same feature to be investigated using either of the beams.

Here is a market overview of instruments made by specialist manufacturers and companies around the globe.

 

Results 1 - 3 of 3

JEOL

JEOL JIB-4501

The JIB-4501 focused ion beam system is a state-of-the-art, high-resolution, digital 2-beam focused ion beam system with newly designed ion optics,...

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JEOL JIB-4000 Single Beam FIB

The JIB-4000 focused ion beam system is a state-of-the-art, high-resolution, digital focused ion beam system with newly designed ion optics and an...

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JEOL JIB-4601F

The JIB-4601F focused ion beam system is a state-of-the-art, high-resolution, digital 2-beam focused ion beam system with newly designed ion optics,...

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