WITec alpha300 A
Combines with Upright Microscope
AFM Electrical Sample Charaterization
AFM Force Spectroscopy
AFM Scan Size X/Y/Z µm
30 x 30 x 10 or 100 x 100 x 20 or 200 x 200 x 20
Nanoscale Surface Characterization: The WITec Atomic Force Microscope alpha300 A is a reliable, high-quality nano-imaging system integrated with a research-grade optical microscope and provides superior optical access, easy cantilever alignment and high-resolution sample survey.