We help scientists to compare scientific instruments
General

Scanning Probe Microscopy (SPM)

The scanning probe suite comprises a variety of instruments with complementary capabilities that enable the measurement of sample topography down to atomic resolution, spectroscopy of local electronic structure, and nanomechanical properties.

Application Notes

 

Atom Manipulation

Atom manipulation often attracts the interest of researchers, not only for observing artificial patterns on the surface, but also since it allows preparing ideal “samples” on surfaces, designed for a specific measurement... read more

 

On-the-Fly Switching Between STM and AFM

Especially for the identification of atomically sized defects, imaging in both feedback modes provides additional insights which are of fundamental importance as an intuitive interpretation of SPM images is often misleading... read more

 

AFM on Si(111)

... read more

 

AFM on Au(111)

... read more

 

AFM on KBr(001)

... read more

 

The Atomic Force Microscope as a Critical Tool for Research in Nanotribology

The atomic force microscope (AFM) is an invaluable tool for studying single-asperity contacts and their structural and tribological properties, including friction, adhesion, wear, and topography... read more

 

Real-Space Identification of Intermolecular Bonding with Atomic Force Microscopy

We report a real-space visualization of the formation of hydrogen bonding in 8-hydroxyquiline (8-hq) molecular assemblies on a Cu(111) substrate using noncontact atomic force microscopy (NC-AFM)... read more

 

Acquisition of atomic site specific force spectroscopy and two-dimensional force maps 

In  non-contact  atomic  force  microscopy  (NC-AFM),  the  forces  acting  between  an  oscillating tip and the surface are measured. A topographic image is obtained by keeping the tip sample interaction force (which  is  measured  as  the  detuning  of  the  resonance  frequency)  constant... read more 

 

UHV Scanning Thermal Microscopy for Nanometer Resolution Quantitative Thermometry

Understanding energy dissipation at the nanoscale requires the ability to probe temperature fields with nanometer resolution... read more 

 

Use of PLL in contact MODE AFM   

Friction force microscopy (FFM) is a useful technique capable of characterizing material mechanical properties,such  as  elastic  module, adhesion, and friction down to atomic scale. When combining static lateral force measurements with dynamic measurements of contact resonance frequencies the sensitivity is improved, i.e. subsurface defects are easier to detect than in conventional quasi static FFM... read more

 

Imaging and Harnessing Nuclear Transmutation at the Atomic Scale

Radioactive decay and its accompanying high-energy radiation are well understood and have been utilized for decades. However, the role of low-energy electrons created during irradiation has only recently begun to be appreciated... read more

 

Atomic Force Microscope Tip Induced Anodic Oxidation

Apart from producing atomic resolution images, the AFM with its sharp tip can also be used in other applications such as nano-grafting and nanolithography... read more

 

 

Results 1 - 24 of 30
Page 1 of 2

Scanning Probe Microscopy (UHV)

ScientaOmicron LT NANOPROBE 4 Probe STM

The Low Temperature LT NANOPROBE defines a new class of analytical instrumentation that merges SEM navigated nanoprobing at LHe temperatures with...

Details

ScientaOmicron MULTISCAN Lab with STM, SEM, SAM

The MULTISCAN LAB is the ultimate tool for the in-situ combination of various surface analysis techniques – simultaneously and on the very same...

Details

SPECS SPM Aarhus 150 with Kolibri AFM

Variable Temperature Scanning Probe Microscope for AFM and STM operation.

Details

RHK UHV SPM PanScan Freedom

The system features 15 K to 400 K operation without the expense and frustration of using liquid cryogens. Pan- Scan-Freedom redefines helium-free low...

Details

SPECS SPM Aarhus 150 HT

With the STM Aarhus 150 HT, SPECS introduces a unique high temperature version by advanced heat flow management to allow imaging metals and...

Details

RHK PanScan LT AFM / STM

For chilled tip and sample applications, the LT PanScan microscopes provide STM and qPlus AFM in a remarkably compact package easily integrated into...

Details

SPECS STM Aarhus 150 Rel.2

STM Aarhus 150 with ultimate atomic performance allows scientists to observe processes on surfaces at a scale of nanometers.

Details

RHK Beetle VT AFM / STM

RHK VT Beetle microscopes offer STM and beam-deflection Contact and NC-AFM, and sample temperatures from 25 K to >1500 K on the sample stage.

Details

SPECS SPM Aarhus 250 EVT

State-of-the-Art AFM and STM Technology for Advanced SPM Research.

Details

RHK LT QuadraProbe 4 Probe STM

RHK’s QuadraProbe offers LT tip and sample, superb SEM resolution, and up to four independently positionable STM or qPlus AFM probes, each providing...

Details

SPECS JT Scanning Tunneling Microscope

The JT-STM (Joule-Thomson) marks the latest significant achievement in UHV scanning probe microscopy - simple handling, unprecedented stability, and...

Details

CreaTec 1 K LT-STM

Ultra stable at low temperatures, offer ultimate STM performance including one of the highest LHe hold times, extremely low drift rates and...

Details

SPECS JT SPM with Tyto SPM Head

The JT-STM (Joule Thomson) marks the latest significant achievement in UHV scanning probe microscopy - simple handling, unprecedented stability, and...

Details

CreaTec 4 K LT-STM / AFM

Ultra stable at low temperatures, offer ultimate STM and AFM performance including one of the highest LHe hold times, extremely low drift rates and...

Details

SPECS SPM Aarhus 150 NAP

The stability and simplicity of the SPM Aarhus design allowes for the extension of the applications in the pressure range between UHV and 100 mbar...

Details

CreaTec 4 K LT-STM

Ultra stable at low temperatures, offer ultimate STM, STS, and IETS performance including one of the highest LHe hold times, extremely low drift...

Details

SPECS SPM Aarhus 150 MBE

Large Sample design of the SPECS Aarhus 150 SPM.

Details

Unisoku RT UHV SPM USM1000

USM 1000 is applied to wide variety of STM, AFM, SNOM observation at room temperature in Ultra High Vacuum. The compact design and the excellent...

Details

ScientaOmicron LT STM

The Omicron LT STM is the first commercial low temperature UHV SPM with proven and guaranteed atomic resolution in STM and QPlus AFM mode at 5 K, now...

Details

Unisoku LT UHV SPM USM1200

USM 1200 is applied to wide variety of STM, AFM, SNOM observation at low temperatures in Ultra High Vacuum. The compact design and the excellent...

Details

ScientaOmicron Cryogenic STM & SFM

The Cryogenic STM & SFM UHV system is designed for low temperature 3He and 4He SPM operation in high magnetic fields of up to 12 T and allows for SPM...

Details

Unisoku 3He LT UHV SPM with SC Magnet USM1300

USM 1300 is applied to wide variety of STM observation at low temperatures in Ultra High Vacuum. The compact design and the excellent vibration...

Details

ScientaOmicron VT SPM

The Variable Temperature UHV SPM (VT SPM) sets the benchmark for UHV AFM and STM technology. It offers a heating cooling concept for SPM in a...

Details

Unisoku VT UHV SPM USM1400

USM 1400 is applied to wide variety of SPM observation at variable temperatures in Ultra High Vacuum.

Details

Page 1 of 2

Cherry Picker

Compare Instruments

Selected
Items

ABOUT Science Duel Life

science.duel.life & mynexttool Is a Free-Access Scientific Instrument Database.

Accurate and truthful parameter filters for all instruments and manufacturers provide a positive experience to our users.

CONTACT

New York, NY

Berlin, Germany

CUSTOMER SUPPORT

Come back tomorrow for more.