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Scanning Probe Microscopy (SPM)

The scanning probe suite comprises a variety of instruments with complementary capabilities that enable the measurement of sample topography down to atomic resolution, spectroscopy of local electronic structure, and nanomechanical properties.

Application Notes

 

Atom Manipulation

Atom manipulation often attracts the interest of researchers, not only for observing artificial patterns on the surface, but also since it allows preparing ideal “samples” on surfaces, designed for a specific measurement... read more

 

On-the-Fly Switching Between STM and AFM

Especially for the identification of atomically sized defects, imaging in both feedback modes provides additional insights which are of fundamental importance as an intuitive interpretation of SPM images is often misleading... read more

 

AFM on Si(111)

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AFM on Au(111)

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AFM on KBr(001)

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The Atomic Force Microscope as a Critical Tool for Research in Nanotribology

The atomic force microscope (AFM) is an invaluable tool for studying single-asperity contacts and their structural and tribological properties, including friction, adhesion, wear, and topography... read more

 

Real-Space Identification of Intermolecular Bonding with Atomic Force Microscopy

We report a real-space visualization of the formation of hydrogen bonding in 8-hydroxyquiline (8-hq) molecular assemblies on a Cu(111) substrate using noncontact atomic force microscopy (NC-AFM)... read more

 

Acquisition of atomic site specific force spectroscopy and two-dimensional force maps 

In  non-contact  atomic  force  microscopy  (NC-AFM),  the  forces  acting  between  an  oscillating tip and the surface are measured. A topographic image is obtained by keeping the tip sample interaction force (which  is  measured  as  the  detuning  of  the  resonance  frequency)  constant... read more 

 

UHV Scanning Thermal Microscopy for Nanometer Resolution Quantitative Thermometry

Understanding energy dissipation at the nanoscale requires the ability to probe temperature fields with nanometer resolution... read more 

 

Use of PLL in contact MODE AFM   

Friction force microscopy (FFM) is a useful technique capable of characterizing material mechanical properties,such  as  elastic  module, adhesion, and friction down to atomic scale. When combining static lateral force measurements with dynamic measurements of contact resonance frequencies the sensitivity is improved, i.e. subsurface defects are easier to detect than in conventional quasi static FFM... read more

 

Imaging and Harnessing Nuclear Transmutation at the Atomic Scale

Radioactive decay and its accompanying high-energy radiation are well understood and have been utilized for decades. However, the role of low-energy electrons created during irradiation has only recently begun to be appreciated... read more

 

Atomic Force Microscope Tip Induced Anodic Oxidation

Apart from producing atomic resolution images, the AFM with its sharp tip can also be used in other applications such as nano-grafting and nanolithography... read more

 

 

Results 1 - 9 of 9

Scanning Probe Microscopy (UHV)

ScientaOmicron LT NANOPROBE 4 Probe STM

The Low Temperature LT NANOPROBE defines a new class of analytical instrumentation that merges SEM navigated nanoprobing at LHe temperatures with...

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SPECS SPM Aarhus 150 NAP

The stability and simplicity of the SPM Aarhus design allowes for the extension of the applications in the pressure range between UHV and 100 mbar...

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Unisoku LT UHV SPM USM1200

USM 1200 is applied to wide variety of STM, AFM, SNOM observation at low temperatures in Ultra High Vacuum. The compact design and the excellent...

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SPECS SPM Aarhus 150 MBE

Large Sample design of the SPECS Aarhus 150 SPM.

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SPECS SPM Aarhus 150 with Kolibri AFM

Variable Temperature Scanning Probe Microscope for AFM and STM operation.

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ScientaOmicron LT STM

The Omicron LT STM is the first commercial low temperature UHV SPM with proven and guaranteed atomic resolution in STM and QPlus AFM mode at 5 K, now...

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SPECS SPM Aarhus 150 HT

With the STM Aarhus 150 HT, SPECS introduces a unique high temperature version by advanced heat flow management to allow imaging metals and...

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ScientaOmicron UHV NANOPROBE 4 Probe SPM

THE UHV NANOPROBE with its four independent SPM probe stations is an analytical instrument specifically designed for local and non-destructive...

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SPECS STM Aarhus 150 Rel.2

STM Aarhus 150 with ultimate atomic performance allows scientists to observe processes on surfaces at a scale of nanometers.

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