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Scanning Probe Microscopy (SPM)

The scanning probe suite comprises a variety of instruments with complementary capabilities that enable the measurement of sample topography down to atomic resolution, spectroscopy of local electronic structure, and nanomechanical properties.

Application Notes


Atom Manipulation

Atom manipulation often attracts the interest of researchers, not only for observing artificial patterns on the surface, but also since it allows preparing ideal “samples” on surfaces, designed for a specific measurement... read more


On-the-Fly Switching Between STM and AFM

Especially for the identification of atomically sized defects, imaging in both feedback modes provides additional insights which are of fundamental importance as an intuitive interpretation of SPM images is often misleading... read more


AFM on Si(111)

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AFM on Au(111)

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AFM on KBr(001)

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The Atomic Force Microscope as a Critical Tool for Research in Nanotribology

The atomic force microscope (AFM) is an invaluable tool for studying single-asperity contacts and their structural and tribological properties, including friction, adhesion, wear, and topography... read more


Real-Space Identification of Intermolecular Bonding with Atomic Force Microscopy

We report a real-space visualization of the formation of hydrogen bonding in 8-hydroxyquiline (8-hq) molecular assemblies on a Cu(111) substrate using noncontact atomic force microscopy (NC-AFM)... read more


Acquisition of atomic site specific force spectroscopy and two-dimensional force maps 

In  non-contact  atomic  force  microscopy  (NC-AFM),  the  forces  acting  between  an  oscillating tip and the surface are measured. A topographic image is obtained by keeping the tip sample interaction force (which  is  measured  as  the  detuning  of  the  resonance  frequency)  constant... read more 


UHV Scanning Thermal Microscopy for Nanometer Resolution Quantitative Thermometry

Understanding energy dissipation at the nanoscale requires the ability to probe temperature fields with nanometer resolution... read more 


Use of PLL in contact MODE AFM   

Friction force microscopy (FFM) is a useful technique capable of characterizing material mechanical properties,such  as  elastic  module, adhesion, and friction down to atomic scale. When combining static lateral force measurements with dynamic measurements of contact resonance frequencies the sensitivity is improved, i.e. subsurface defects are easier to detect than in conventional quasi static FFM... read more


Imaging and Harnessing Nuclear Transmutation at the Atomic Scale

Radioactive decay and its accompanying high-energy radiation are well understood and have been utilized for decades. However, the role of low-energy electrons created during irradiation has only recently begun to be appreciated... read more


Atomic Force Microscope Tip Induced Anodic Oxidation

Apart from producing atomic resolution images, the AFM with its sharp tip can also be used in other applications such as nano-grafting and nanolithography... read more



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Scanning Probe Microscopy (UHV)

ScientaOmicron Cryogenic STM & SFM

The Cryogenic STM & SFM UHV system is designed for low temperature 3He and 4He SPM operation in high magnetic fields of up to 12 T and allows for SPM...



RHK VT Beetle microscopes offer STM and beam-deflection Contact and NC-AFM, and sample temperatures from 25 K to >1500 K on the sample stage.


Unisoku 4He LT UHV SPM with SC Magnet USM1500

USM 1500 is applied to wide variety of SPM observation at low temperatures in Ultra High Vacuum.


SPECS JT Scanning Tunneling Microscope

The JT-STM (Joule-Thomson) marks the latest significant achievement in UHV scanning probe microscopy - simple handling, unprecedented stability, and...


ScientaOmicron UHV NANOPROBE 4 Probe SPM

THE UHV NANOPROBE with its four independent SPM probe stations is an analytical instrument specifically designed for local and non-destructive...


CreaTec 4 K LT-STM

Ultra stable at low temperatures, offer ultimate STM, STS, and IETS performance including one of the highest LHe hold times, extremely low drift...


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