We help scientists to compare scientific instruments
General

Scanning Probe Microscopy (SPM)

The scanning probe suite comprises a variety of instruments with complementary capabilities that enable the measurement of sample topography down to atomic resolution, spectroscopy of local electronic structure, and nanomechanical properties.

Application Notes

 

Atom Manipulation

Atom manipulation often attracts the interest of researchers, not only for observing artificial patterns on the surface, but also since it allows preparing ideal “samples” on surfaces, designed for a specific measurement... read more

 

On-the-Fly Switching Between STM and AFM

Especially for the identification of atomically sized defects, imaging in both feedback modes provides additional insights which are of fundamental importance as an intuitive interpretation of SPM images is often misleading... read more

 

AFM on Si(111)

... read more

 

AFM on Au(111)

... read more

 

AFM on KBr(001)

... read more

 

The Atomic Force Microscope as a Critical Tool for Research in Nanotribology

The atomic force microscope (AFM) is an invaluable tool for studying single-asperity contacts and their structural and tribological properties, including friction, adhesion, wear, and topography... read more

 

Real-Space Identification of Intermolecular Bonding with Atomic Force Microscopy

We report a real-space visualization of the formation of hydrogen bonding in 8-hydroxyquiline (8-hq) molecular assemblies on a Cu(111) substrate using noncontact atomic force microscopy (NC-AFM)... read more

 

Acquisition of atomic site specific force spectroscopy and two-dimensional force maps 

In  non-contact  atomic  force  microscopy  (NC-AFM),  the  forces  acting  between  an  oscillating tip and the surface are measured. A topographic image is obtained by keeping the tip sample interaction force (which  is  measured  as  the  detuning  of  the  resonance  frequency)  constant... read more 

 

UHV Scanning Thermal Microscopy for Nanometer Resolution Quantitative Thermometry

Understanding energy dissipation at the nanoscale requires the ability to probe temperature fields with nanometer resolution... read more 

 

Use of PLL in contact MODE AFM   

Friction force microscopy (FFM) is a useful technique capable of characterizing material mechanical properties,such  as  elastic  module, adhesion, and friction down to atomic scale. When combining static lateral force measurements with dynamic measurements of contact resonance frequencies the sensitivity is improved, i.e. subsurface defects are easier to detect than in conventional quasi static FFM... read more

 

Imaging and Harnessing Nuclear Transmutation at the Atomic Scale

Radioactive decay and its accompanying high-energy radiation are well understood and have been utilized for decades. However, the role of low-energy electrons created during irradiation has only recently begun to be appreciated... read more

 

Atomic Force Microscope Tip Induced Anodic Oxidation

Apart from producing atomic resolution images, the AFM with its sharp tip can also be used in other applications such as nano-grafting and nanolithography... read more

 

 

Createc Fisher

CreaTec 4 K LT-STM / AFM

Ultra stable at low temperatures, offer ultimate STM and AFM performance including one of the highest LHe hold times, extremely low drift rates and...

Details

CreaTec 1 K LT-STM

Ultra stable at low temperatures, offer ultimate STM performance including one of the highest LHe hold times, extremely low drift rates and...

Details

CreaTec 4 K LT-STM

Ultra stable at low temperatures, offer ultimate STM, STS, and IETS performance including one of the highest LHe hold times, extremely low drift...

Details

Cherry Picker

Refine search in Scanning Probe Microscopy (UHV)

[-]Temperature Range

Compare Instruments

Selected
Items

ABOUT Science Duel Life

science.duel.life & mynexttool Is a Free-Access Scientific Instrument Database.

Accurate and truthful parameter filters for all instruments and manufacturers provide a positive experience to our users.

CONTACT

New York, NY

Berlin, Germany

CUSTOMER SUPPORT

Come back tomorrow for more.